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灵动的设计与强大技术力量相结合

通过开创性的模块化设计,SIKORA 公司的 PURITY CONCEPT 系统为塑料材料行业提供了一款通用型的当前离线检测系统,具有广阔的市场前景。根据不同的应用需求,系统可以配备 X 射线(X)、红外线 (IR) 或者光学传感技术 (V) ,分别应用于生产过程中或者样品检测,并且该系统可以检测出 50 µm 以上的杂质。PURITY CONCEPT 系统结合了SIKORA 公司数十年在线缆和管材行业的技术积累。

技术参数

Measuring Principle*PURITY CONCEPT X: X-ray technology
PURITY CONCEPT V: Optical CMOS Line Scan color camera
ApplicationPellets, flakes, films/tapes, sheets and injection moulded parts
Detectable ContaminationPURITY CONCEPT X: metallic, inhomogeneities, cross-contamination
PURITY CONCEPT V: contamination and black specs in transparent material, respectively, on non-transparent material and discolorations
Smallest Detectable Contamination SizeX-ray: 50 μm (cube 3D), 50 x 50 x 50 μm
Optics: 50 μm (square 2D), 50 x 50 μm
Permissible Environmental Temperature/Pellet TemperaturePURITY CONCEPT X: +0 to +40 °C
PURITY CONCEPT V: + 5 to + 45 °C
InterfacesUSB
Optional: LAN
Power SupplyPURITY CONCEPT X: 230 V AC (alternatively 110 V AC) ± 10 %, 50/60 Hz, 1600 VA
PURITY CONCEPT V: 230 V AC ± 10 %, 50/60 Hz, ca. 1.200 W
Dimensions PURITY CONCEPT X: 1,340 x 1,297 x 758 mm (excl. wheels)
PURITY CONCEPT V: 1,090 x 575 x 911 mm
(width x height x depth)
* The PURITY CONCEPT Systems devices can be equipped with infrared technology on demand