PURITY SCANNER ADVANCED

With the groundbreaking models of the PURITY CONCEPT Systems SIKORA gives an outlook on the versatile potential of its systems for offline inspection and analysis of the plastic material. Depending on the application, the systems are equipped with X-ray technology (X) or optical sensors (V) to be used during the production or for sample testing and detect contamination from 50 µm. Regarding the integrated technologies SIKORA draws on several decades of experience in the cable as well as hose and tube industry.
PURITY CONCEPT X is based on X-ray technology and detects and analyzes for example metallic contamination inside opaque pellets and flakes. Thanks to the modular design concept, colored films and tapes can also be inspected.
PURITY CONCEPT V is based on optical sensors and detects and analyzes contamination or defects such as “black specks” or yellow discolorations on transparent pellets and flakes. Thanks to the modular design concept, transparent films and tapes can also be inspected.
Measuring Principle* | PURITY CONCEPT X: X-ray technology PURITY CONCEPT V: Optical CMOS Line Scan color camera |
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Application | Pellets, flakes, films/tapes, sheets and injection moulded parts |
Detectable Contamination | PURITY CONCEPT X: metallic, inhomogeneities,
cross-contamination PURITY CONCEPT V: contamination and black specks in transparent material, respectively, on the surface of diffuse and colored material |
Smallest Detectable Contamination Size | X-ray: 50 μm (cube 3D), 50 x 50 x 50 μm Optical: 50 μm (square 2D), 50 x 50 μm |
Permissible Environmental Temperature/Pellet Temperature | + 10 to + 40 °C |
Interfaces | USB Optional: LAN |
Power Supply | PURITY CONCEPT X: 230 V AC (alternativ 100 V AC oder 115 V AC) ± 10%, 50/60 Hz PURITY CONCEPT V: 100 - 240 V AC ± 10 %, 50/60 Hz |
Dimensions | PURITY CONCEPT X: 1,309 x 831 x 1,882 mm
PURITY CONCEPT V: 1,090 x 575 x 921 mm (width x height x depth) |