- Highest material quality and stable production processes
- Modular concept for different analysis requirements (inspection of pellets, flakes, films/tapes)
- Offline operation
- X-ray, Infrared or optical inspection
With the groundbreaking models of the PURITY CONCEPT Systems SIKORA gives an outlook on the versatile potential of its systems for offline inspection and analysis of the plastic material. Depending on the application, the systems are equipped with X-ray technology (X), Infrared technology (IR) or optical sensors (V) to be used during the production or for sample testing and detect contamination from 50 µm. Regarding the integrated technologies SIKORA draws on several decades of experience in the cable as well as hose and tube industry.
PURITY CONCEPT X is based on X-ray technology and detects and analyzes for example metallic contamination inside opaque pellets and flakes. Thanks to the modular design concept, colored films and tapes can also be inspected.
PURITY CONCEPT V is based on optical sensors and detects and analyzes contamination or defects such as “black specs” or yellow discolorations on transparent pellets and flakes. Thanks to the modular design concept, transparent films and tapes can also be inspected.