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Flexible design and strong technologies

With the groundbreaking models of the PURITY CONCEPT Systems SIKORA gives an outlook on the versatile potential of its systems for offline inspection and analysis of the plastic material. Depending on the application, the systems are equipped with X-ray technology (X), Infrared technology (IR) or optical sensors (V) to be used during the production or for sample testing and detect contamination from 50 µm. Regarding the integrated technologies SIKORA draws on several decades of experience in the cable as well as hose and tube industry.

Specifications

Measuring Principle*PURITY CONCEPT X: X-ray technology
PURITY CONCEPT V: Optical CMOS Line Scan color camera
ApplicationPellets, flakes, films/tapes, sheets and injection moulded parts
Detectable ContaminationPURITY CONCEPT X: metallic, inhomogeneities, cross-contamination
PURITY CONCEPT V: contamination and black specs in transparent material, respectively, on non-transparent material and discolorations
Smallest Detectable Contamination SizeX-ray: 50 μm (cube 3D), 50 x 50 x 50 μm
Optics: 50 μm (square 2D), 50 x 50 μm
Permissible Environmental Temperature/Pellet TemperaturePURITY CONCEPT X: + 5 – + 40 °C
PURITY CONCEPT V: + 5 – + 45 °C
InterfacesUSB
Optional: LAN
Power SupplyPURITY CONCEPT X: 230 V AC (alternatively 110 V AC) ± 10 %, 50/60 Hz, 1600 VA
PURITY CONCEPT V: 230 V AC ± 10 %, 50/60 Hz, ca. 1.200 W
Dimensions PURITY CONCEPT X: 1,340 x 1,297 x 758 mm (excl. wheels)
PURITY CONCEPT V: 1,090 x 575 x 911 mm
(width x height x depth)