As a manufacturer and international supplier of innovative measuring, control and testing devices for the wire and cable, hose and tube, metals as well as optical fiber and optical fiber cable industries, SIKORA offers quality control systems for various application areas, such as diameter measurement.
Diffraction based diameter measurement procedure
The measurement principle of SIKORA’s LASER Series 2000 and LASER Series 6000 is based on diffraction analysis. For this purpose, a high-resolution, fan-shaped laser beam is pointed directly onto a CCD line. Thus, a shadow image of the product is created on the line sensor. Due to the refraction of light on the surface of the measured product, intensity variations are registered at the transitions from dark to light. Based on the diffraction of light theory, information on intensity variations are used to calculate tangents of the left and right geometric shadow borders. Together with the tangents of the measuring plane, which is shifted by 90 degrees, four tangents touching the product result. Thereby, the diameter is determined with an accuracy to the submicrometer, independent of its position in the measuring field.
SIKORA’s measuring method works contactless with an extremely short exposure time and reaches very high single value precision which is important for determining the standard deviation of the production processes. Several thousand measurements per axis and second at product diameters from 0.05 to 500 mm are possible. Measuring devices with the CCD line sensor method record the diameter of transparent as well as opaque products in two or three planes and always work precisely, independent from the measured product.
In addition to the classic diameter measuring gauges based on laser technology, SIKORA’s portfolio also includes systems that reliably measure the diameter as well as the wall thickness and eccentricity. These include the CENTERVIEW 8000, X-RAY 6000/X-RAY 6000 PRO and the X-RAY ADVANCED/NXT. These systems are based on optical inductive as well as X-ray measuring methods.